Test & burn-in (TBI) sockets represent a small but technically challenging segment of the connector industry. Designs are robust, leading-edge, often produced in small quantities at very high costs, and are tested in excess of 100,000 touchdowns before socket rebuild. The market segment focuses primarily on the IC industry, and system prototyping, emulation, and test. Singulated and strip test sockets and burn-in sockets are considered part of the electronic connector market, while wafer probes are designed to test bare die and wafers in the semiconductor equipment market.